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SN74LVTH182512DGGR|TI|simage
SN74LVTH182512DGGR|TI|limage
Misceláneos de lógica y temporizador

SN74LVTH182512DGGR

Scan Test Device -40°C to 85°C 64-Pin TSSOP T/R

Texas Instruments

Especificaciones técnicas del producto
  • EU RoHS
    Compliant
  • ECCN (US)
    EAR99
  • Part Status
    Active
  • HTS
    8542.39.00.90
  • SVHC
    Yes
  • Automotive
    No
  • PPAP
    No
  • Type
    Scan Test Device
  • Minimum Operating Temperature (°C)
    -40
  • Maximum Operating Temperature (°C)
    85
  • Supplier Temperature Grade
    Commercial
  • Packaging
    Tape and Reel
  • Typical Operating Supply Voltage (V)
    3.3
  • Absolute Propagation Delay Time (ns)
    20
  • Number of Elements per Chip
    2
  • Number of Element Inputs
    9
  • Minimum Operating Supply Voltage (V)
    2.7
  • Maximum Operating Supply Voltage (V)
    3.6
  • Mounting
    Surface Mount
  • Package Height
    1.05(Max)
  • Package Width
    6.1
  • Package Length
    17
  • PCB changed
    64
  • Standard Package Name
    SO
  • Supplier Package
    TSSOP
  • Pin Count
    64
  • Lead Shape
    Gull-wing

Documentación y Recursos

Hojas de datos
Recursos de diseño