Arrow Electronic Components Online
HEF4011UBT653|NXP|simage
HEF4011UBT653|NXP|limage
Logic Gates

HEF4011UBT,653

NAND Gate 4-Element 2-IN 14-Pin SO T/R

NXP Semiconductors
Hojas de datos 

Especificaciones técnicas del producto
  • RoHS (Unión Europea)
    Supplier Unconfirmed
  • ECCN (Estados Unidos)
    EAR99
  • Estatus de pieza
    Obsolete
  • Código HTS
    8542330001
  • Automotive
    No
  • PPAP
    No
  • Logic Family
    HEF4000
  • Logic Function
    NAND
  • Number of Elements per Chip
    4
  • Number of Element Inputs
    2-IN
  • Number of Output Enables per Element
    0
  • Number of Selection Inputs per Element
    0
  • Number of Element Outputs
    1
  • Maximum Propagation Delay Time @ Maximum CL (ns)
    120@5V|50@10V|40@15V
  • Absolute Propagation Delay Time (ns)
    120
  • Maximum Low Level Output Current (mA)
    3.6(Min)
  • Maximum High Level Output Current (mA)
    -3.6(Min)
  • Minimum Operating Supply Voltage (V)
    3
  • Typical Operating Supply Voltage (V)
    3.3|5|9|12
  • Maximum Operating Supply Voltage (V)
    15
  • Maximum Quiescent Current (uA)
    4
  • Propagation Delay Test Condition (pF)
    50
  • Minimum Operating Temperature (°C)
    -40
  • Maximum Operating Temperature (°C)
    85
  • Packaging
    Tape and Reel
  • Mounting
    Surface Mount
  • Package Height
    1.5(Max)
  • Package Width
    4(Max)
  • Package Length
    8.75(Max)
  • PCB changed
    14
  • Standard Package Name
    SO
  • Supplier Package
    SO
  • Pin Count
    14

Documentación y Recursos

Hojas de datos
Recursos de diseño